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Interview Question · Concept

Where the Square Law Breaks Down

L1 JuniorL2 Mid-Levelmosdevicesizing
  • Likely at Texas Instruments

The Question

The interviewer asks

You size a 0.15 µm device with the square law and it delivers about half the current you computed. Why?

Reveal the Model Answer

The square law assumes constant mobility, carrier velocity proportional to field and a fixed threshold. A short device breaks all three. The vertical field degrades mobility, and carriers hit velocity saturation. Halo implants (extra doping near the source and drain) also raise the threshold. On sky130 at 1.8 V a W/L = 10 device reached 46 % of the square-law current at L = 0.15 µm and 87 % at L = 1 µm. Size short devices from their measured curves.

DC sweepSame W/L = 10, Two Lengths, VDS = 1.8 VDrain current against gate voltage for the 1.5/0.15 µm and 10/1 µm devices.
  • id_short
  • id_long
00.2 mA0.4 mA0.6 mA0.8 mA1.0 mA1.2 mA1.4 mA1.6 mADrain current00.2 V0.4 V0.6 V0.8 V1.0 V1.2 V1.4 V1.6 V1.8 VGate-source voltage VGSL = 0.15 µm: 0.731 mAL = 1 µm: 1.396 mA00.5 mA1.0 mA1.5 mADrain current00.5 V1.0 V1.5 VGate-source voltage VGSL = 0.15 µm: 0.731 mAL = 1 µm: 1.396 mA
  1. Gate-source voltage VGS 1.2 Vid_short = 281.7 µA · id_long = 449.8 µA

    At 1.2 V the long device carries 450 µA, the short one 282 µA.

  2. Gate-source voltage VGS 1.8 Vid_short = 731.1 µA · id_long = 1.396 mA

    At 1.8 V: 1.396 mA against 0.731 mA. The short device gains less from each extra 0.1 V of gate drive.

Read the plot as a table
Gate-source voltage VGSid_shortid_long
0 V2.408 pA2.616 pA
200 mV88.92 pA189.6 pA
400 mV12.35 nA39.33 nA
600 mV1.314 µA4.15 µA
800 mV33.49 µA66.39 µA
1 V141.9 µA222.6 µA
1.2 V281.7 µA449.8 µA
1.4 V429.6 µA731.5 µA
1.6 V580.2 µA1.051 mA
1.8 V731.1 µA1.396 mA

Two sky130 devices with the same W/L = 10. The square law says they carry the same current; the short one carries about half.

Self-Check

Tick each key point you covered in your answer.

What Interviewers Listen For (Junior)

A good junior answer names mobility degradation and velocity saturation. It says the square law shows only the direction of a change, not its size.

Cross-Questions

Where the interviewer goes next. Open a node to practise that follow-up.

WhyWhat IfProve ItCompareScale It

  1. Where the Square Law Breaks Down
  2. WhyChecking the Square Law with a Square-Root PlotL1 JuniorL2 Mid-Level

    How can you tell from a simulation whether a device follows the square law?

    Reveal the Model Answer

    Plot the square root of the drain current against V_GS in saturation. A square-law device gives a straight line that crosses zero at the threshold. A bend at high V_GS shows mobility degradation and velocity saturation. The shape near the threshold shows the move into weak inversion.

    DC sweep√ID Against VGS, W/L = 10 at Three LengthsA device that follows the square law draws a straight line. The fit uses the L = 1 µm curve at 1.0 V and 1.2 V.
    • s1
    • s2
    • s3
    • fit
    01020304050Square root of ID in õA00.2 V0.4 V0.6 V0.8 V1.0 V1.2 V1.4 V1.6 V1.8 VGate-source voltage VGSfit: Vth = 0.526 V01020304050Square root of ID in õA00.5 V1.0 V1.5 VGate-source voltage VGSfit: Vth = 0.526 V
    1. Gate-source voltage VGS 1 Vs1 = 11.91 · s2 = 12.31 · s3 = 14.92 · fit = 14.92

      s1, s2 and s3 are the 0.15, 0.3 and 1 µm devices. The fit passes through the long device here, at 14.92.

    2. Gate-source voltage VGS 1.2 Vs1 = 16.78 · s2 = 17.89 · s3 = 21.21 · fit = 21.21

      Second fit point: 21.21. The line's slope is 31.4 õA per volt, and it crosses zero at Vth = 0.526 V.

    3. Gate-source voltage VGS 1.5 Vs1 = 22.47 · s2 = 24.91 · s3 = 29.79 · fit = 30.64

      The long device already bends below its own line. The short one has bent from the start: its curve is flatter everywhere above 1 V.

    4. Gate-source voltage VGS 1.8 Vs1 = 27.04 · s2 = 30.64 · s3 = 37.36 · fit = 40.07

      The fit predicts 40.07, which is 1.606 mA. The long device reaches 37.36 (1.396 mA), 13 % short. The short one reaches 27.04 (0.731 mA), 54 % short.

    Read the plot as a table
    Gate-source voltage VGSs1s2s3fit
    0 V0.0015520.0014540.001617-16.53
    200 mV0.009430.0076760.01377-10.24
    400 mV0.11110.10060.1983-3.949
    600 mV1.1461.0862.0372.34
    800 mV5.7875.9118.1488.629
    1 V11.9112.3114.9214.92
    1.2 V16.7817.8921.2121.21
    1.4 V20.7322.7327.0527.5
    1.5 V22.4724.9129.7930.64
    1.6 V24.0926.9532.4333.79
    1.8 V27.0430.6437.3640.07

    Measured on ngspice 42, SKY130 tt (901 points). The fit line is computed in the same run from the L = 1 µm curve.

    Self-Check

    Tick each key point you covered in your answer.

  3. Prove ItSolve E2.1.1: A Switching Point at Mid-RailSimulator-graded

    Show it, don't just say it: this Silicon Lab problem is graded by the simulator.

    Open Problem E2.1.1

  4. CompareSizing a Transistor with gm/IDL1 JuniorL2 Mid-Level

    You need g_m = 200 µS from an NMOS at a chosen length. Describe, step by step, how you size it with the g_m/I_D method (g_m/I_D is transconductance per unit of drain current).

    Reveal the Model Answer

    Pick g_m/I_D for the trade you want: high for low current, low for speed. Then I_D is g_m divided by g_m/I_D. Read the current density I_D/W from a measured chart for that length, and get W as I_D over that density. Finally check g_m on a bench. The chart works in any inversion region, where the square law would not.

    DC sweepgm/ID Against Current Density for Three LengthsNMOS with W = 2 µm at VDS = 0.9 V; the x axis is the base-10 logarithm of ID/W in A/µm, so −10.5 is 32 pA/µm, −9 is 1 nA/µm and −4 is 100 µA/µm.
    • L = 0.15 µm
    • L = 0.5 µm
    • L = 1 µm
    051015202530gm/ID in 1/V-10-9-8-7-6-5-4log10 of I_D/W (A per µm)weak inversion above 20strong inversion below 100102030gm/ID in 1/V-10-8-6-4log10 of I_D/W (A per µm)weak inversion above 20strong inversion below 10
    1. log10 of I_D/W (A per µm) -10.5L = 0.15 µm = 25.18 · L = 0.5 µm = 26.45 · L = 1 µm = 28.31

      At 32 pA/µm every length is deep in weak inversion, flat at its limit 1/(n·UT): 25.2, 26.4 and 28.3 per volt.

    2. log10 of I_D/W (A per µm) -6.198L = 0.15 µm = 21.16 · L = 0.5 µm = 20 · L = 1 µm = 18.16

      The L = 0.5 µm curve crosses 20 at 0.634 µA/µm; above 20 we call a device weakly inverted.

    3. log10 of I_D/W (A per µm) -6L = 0.15 µm = 20.3 · L = 0.5 µm = 18.78 · L = 1 µm = 16.5

      At 1 µA/µm the lengths spread to 20.3, 18.8 and 16.5, because a longer device leaves weak inversion at a lower density.

    4. log10 of I_D/W (A per µm) -5.557L = 0.15 µm = 17.83 · L = 0.5 µm = 15 · L = 1 µm = 12.07

      L = 0.5 µm reaches 15 at 2.77 µA/µm, in the middle of moderate inversion, where the sizing example below starts.

    5. log10 of I_D/W (A per µm) -5L = 0.15 µm = 13.61 · L = 0.5 µm = 9.168 · L = 1 µm = 6.647

      At 10 µA/µm the values are 13.6, 9.17 and 6.65, and the long devices are now in strong inversion, below 10.

    6. log10 of I_D/W (A per µm) -4L = 0.15 µm = 4.114 · L = 0.5 µm = 2.295 · L = 1 µm = 1.427

      At 100 µA/µm gm/ID has fallen to 4.11, 2.29 and 1.43, so pushing more current through the same width buys little extra gm.

    Read the plot as a table
    log10 of I_D/W (A per µm)L = 0.15 µmL = 0.5 µmL = 1 µm
    -10.525.1826.4528.31
    -1025.1626.3528.15
    -925.0425.8927.4
    -824.6524.725.54
    -723.4722.6722.44
    -6.19821.162018.16
    -620.318.7816.5
    -5.55717.831512.07
    -513.619.1686.647
    -44.1142.2951.427

    The measured chart this method reads: gm/ID against current density, one curve per length.

    The Bench That Checks a Sized DeviceIB sets the drain current, and an amplifier compares the drain with 0.9 V and drives the gate, so VDS stays at 0.9 V whatever the device needs.
    The bench that checks a sized device−++VDD1.8 VIB6.667 µAM3W/L = 2.4/0.5E1VREF0.9 Vd30.900 Vg30.715 V
    1. The current is set

      IB pushes 6.667 µA into the drain, and M3 must carry all of it.

      6.667 µA

    2. The amplifier finds the gate voltage

      If the drain rises above 0.9 V, the amplifier raises the gate, M3 conducts more and pulls the drain back down, until the loop settles with VGS = 0.715 V.

    3. Read gm

      Sweep IB a little and watch the gate: gm = ΔID/ΔVGS, and the lab measures 100.3 µS.

    Read the circuit as text
    • IB current source (6.667 µA): + → VDD, − → d3
    • M3 NMOS transistor (W/L = 2.4/0.5): gate → g3, drain → d3, source → 0
    • E1 op-amp: −in → n1, +in → d3, out → g3
    • VREF voltage source (0.9 V): + → n1, − → 0
    • d3 = 0.900 V
    • g3 = 0.715 V

    The last step: a bench that holds the sized device at its bias and measures gm.

    Self-Check

    Tick each key point you covered in your answer.

    What Interviewers Listen For (Junior)

    A good junior answer walks through the four steps in order. It explains what a high g_m/I_D costs and what a low one costs.

    Misconception

    "g_m/I_D = 2/V_ov, so a small overdrive gives unlimited efficiency."

    That is the square law. The device saturates at about 1/(n·U_T), 25 to 28 V⁻¹ for the sky130 1.8 V NMOS, once it enters weak inversion.

    Source ASIC Point lesson E2.5 (measured; Jespers and Murmann, as cited)

    Half-Truth

    "Always bias at the highest g_m/I_D to save power."

    High g_m/I_D needs wide devices with large capacitance, so the transistor gets slow. The choice is a trade between current, area and speed.

  5. WhyWhy One Chart per Length Is EnoughL2 Mid-Level

    Why does one measured g_m/I_D chart per channel length size a device of any width?

    Reveal the Model Answer

    At a fixed length, g_m/I_D depends on how hard the channel is driven. The current density I_D/W captures that, not the width itself. Doubling W at the same density doubles I_D and g_m and leaves g_m/I_D unchanged. So one curve of g_m/I_D against density per length covers every width.

    Self-Check

    Tick each key point you covered in your answer.

  6. Prove ItSolve E5.3.1: A Bench for the Five-Transistor OTASimulator-graded

    Show it, don't just say it: this Silicon Lab problem is graded by the simulator.

    Open Problem E5.3.1

  7. What IfChanging Length After Sizing from the ChartL2 Mid-Level

    What if you change the channel length after sizing from the chart? Can you keep the same chart?

    Reveal the Model Answer

    No. The chart holds for one length, because g_m/I_D at a given density changes with L. Take the chart for the new length and read a new density for the same g_m/I_D. A longer device gives more r_o and gain, but it adds capacitance and is slower.

    Self-Check

    Tick each key point you covered in your answer.

    Misconception

    "Keep W/L the same and the operating point does not change."

    That holds only under the square law. Short-channel effects change g_m/I_D at a fixed W/L, so read the chart for the new length.

    Source Lesson E2.5 key points

  8. CompareHigh vs Low gm/IDL1 JuniorL2 Mid-Level

    Compare biasing a transistor at high g_m/I_D with biasing it at low g_m/I_D.

    Reveal the Model Answer

    High g_m/I_D, near weak inversion, gives the most transconductance per microamp. But the device is wide and slow, and its threshold mismatch becomes a larger current error. Low g_m/I_D, strong inversion, costs current but gives small, fast devices and better current matching. Input pairs often sit high for noise and offset; mirrors and fast stages sit lower.

    Self-Check

    Tick each key point you covered in your answer.

  9. Scale ItDesigning an OTA to a SpecificationL2 Mid-LevelL3 Senior

    You get a brief for an OTA: load, unity-gain frequency, current budget, gain and input range. In what order do you size it?

    Reveal the Model Answer

    Start with f_u and C_L, which give g_m. The current budget then gives g_m/I_D (transconductance per unit current), and a measured chart gives W. The gain sets the length, and the input range checks the tail and the load. Keep margin on f_u, because the output node carries more than C_L. Check every line at every input level the brief names.

    From Brief to Sized OTAArrows show which number feeds the next decision.
    From brief to sized OTAArrows show which number feeds the next decision. component fu and CL 10 MHz into 2 pF component gm of M1 and M2 ≥ 125.7 µS; aim 157µS component Current budget 2 µA bias + 16 µA tail component gm/ID ≥ 19.6 /V; pick 22 component Width from chart 0.181 µA/µm: W = 40µm component Length for gain L = 1 µm for M1-M4 component Input range tail 8 × 8/2, load 4/1 component Simulate andcompare every line at 0.7, 0.9,1.1 V 2π·fu·CLI_D ≈ 8 µA
    1. Speed sets gm

      Into a capacitive load, fu = gm1/(2πCL), so gm1 ≥ 2π × 10 MHz × 2 pF = 125.7 µS. The output node carries more than CL, and the low end of the input range costs current, so aim 25 % higher: 157 µS.

    2. Current sets gm/ID

      Keep 2 µA for the bias diode and copy it eight times for a 16 µA tail: about 8 µA per input device. Then gm/ID ≥ 157/8 = 19.6 V−1. Pick 22, in moderate inversion.

    3. The chart sets W; gain sets L

      The chart below gives 0.181 µA/µm at gm/ID = 22, so W = 8 µA / 0.181 µA/µm = 44 µm: take 40. Gain is gm/(gds2 + gds4); at a fixed current only L moves the gds terms, and L = 1 µm clears 40 dB in E5.3's OTA.

    4. Range, then simulate

      The lower edge is VGS1 + VDsat5: a wide pair keeps VGS1 low and a wide tail (8 × 8/2) keeps VDsat5 low. The upper edge is VDD − VSG3 + Vth1: a 4/1 load keeps VSG3 small. Then run every line of the brief.

    Read the diagram as text
    • fu and CL: 10 MHz into 2 pF
    • gm of M1 and M2: ≥ 125.7 µS; aim 157 µS
    • Current budget: 2 µA bias + 16 µA tail
    • gm/ID: ≥ 19.6 /V; pick 22
    • Width from chart: 0.181 µA/µm: W = 40 µm
    • Length for gain: L = 1 µm for M1-M4
    • Input range: tail 8 × 8/2, load 4/1
    • Simulate and compare: every line at 0.7, 0.9, 1.1 V
    • fu and CL → gm of M1 and M2: 2π·fu·CL
    • gm of M1 and M2 → gm/ID
    • Current budget → gm/ID: I_D ≈ 8 µA
    • gm/ID → Width from chart
    • Width from chart → Length for gain
    • Length for gain → Input range
    • Input range → Simulate and compare

    Hand numbers come from formulas; the chart and the check come from runs.

    Self-Check

    Tick each key point you covered in your answer.

  10. Prove ItSolve E5.3.1: A Bench for the Five-Transistor OTASimulator-graded

    Show it, don't just say it: this Silicon Lab problem is graded by the simulator.

    Open Problem E5.3.1

  11. Prove ItSolve E5.3.1: A Bench for the Five-Transistor OTASimulator-graded

    Show it, don't just say it: this Silicon Lab problem is graded by the simulator.

    Open Problem E5.3.1

  12. Scale ItProcess Corners and Temperature for One DeviceL2 Mid-LevelL3 Senior

    How much does a sky130 device move across process corners and temperature, and what does that mean for sign-off?

    Reveal the Model Answer

    A lot: the short NMOS current moved from -29 % to +38 % and the short PMOS from -47 % to +68 % across the corners. Heat lowers both threshold and mobility, so below the zero-temperature-coefficient bias the current rises with temperature and above it falls. Sign-off crosses corners with the supply range and both temperature ends. Check each corner's name by measurement: here sf is fast NMOS, slow PMOS, the opposite of the library comment.

    Self-Check

    Tick each key point you covered in your answer.

What People Get Wrong

Common wrong answers and why they fail.

Half-Truth

"The square law is accurate enough for hand sizing."

For long devices it is close; for minimum-length sky130 devices it overestimates the current about twofold. It gives the direction of a change, not the number.

Source ASIC Point lesson E2.3 (measured)

Buzzword Without Mechanism

Blames "short-channel effects" without naming one.

The answer needs the mechanisms. Mobility falls with vertical field, carrier velocity saturates at high lateral field, and the threshold shifts with length.

Learn It, Then Prove It